High-Pressure Reflection High-Energy Electron Diffraction (RHEED)
Regulating thin film growth! Providing diagnostic tools for real-time process monitoring.
"High-Pressure Reflection High-Energy Electron Diffraction (RHEED)" is high-pressure reflection high-energy electron diffraction. It provides a diagnostic tool for real-time in-situ process monitoring for PLD/PED systems. It adjusts thin film growth based on structural data from intensity and diffraction. 【Features】 ■ Adjusts thin film growth based on structural data from intensity and diffraction. *For more details, please refer to the PDF document or feel free to contact us.
- Company:ハイテック・システムズ
- Price:Other